Selecting the most reliable design under type-II censored accelerated testing
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Publication:5288678
DOI10.1109/24.249592zbMath0775.62264OpenAlexW2102938451MaRDI QIDQ5288678
Dong Shang Chang, Deng-Yuan Huang, Sheng-Tsaing Tseng
Publication date: 16 August 1993
Published in: IEEE Transactions on Reliability (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1109/24.249592
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