TEST: Testing Environment for Embedded Systems Based on TTCN-3 in SILS

DOI10.1007/978-3-642-10619-4_25zbMath1185.68085OpenAlexW133311536MaRDI QIDQ5305786

Hochang Chae, Xiulin Jin, Seonghun Lee, Jeonghun Cho

Publication date: 23 March 2010

Published in: Advances in Software Engineering (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/978-3-642-10619-4_25

zbMATH Keywords

testing environmentembedded system softwareTTCN-3 testing system

Mathematics Subject Classification ID

Computer system organization (68M99) Reliability, testing and fault tolerance of networks and computer systems (68M15) Theory of software (68N99)

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