Address Sequences and Backgrounds with Different Hamming Distances for Multiple Run March Tests

DOI10.2478/V10006-008-0030-YzbMath1178.94268OpenAlexW2133514126MaRDI QIDQ5324518

Svetlana Yarmolik

Publication date: 3 August 2009

Published in: International Journal of Applied Mathematics and Computer Science (Search for Journal in Brave)

Full work available at URL: https://eudml.org/doc/207889

zbMATH Keywords

Hamming distanceGray codememory addressmemory testingMarch memory testmemory backgroundneighbourhood pattern sensitive faultsrandom-access memory (RAM)

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Related Items (2)

Analysis of multibackground memory testing techniques ⋮ Controlled random tests

Cites Work

• The repeated nondestructive march tests with variable address sequences
• Testing Memories for Single-Cell Pattern-Sensitive Faults
• Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor Random-Access Memories
• Detection oF Pattern-Sensitive Faults in Random-Access Memories
• A Survey of Combinatorial Gray Codes

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