Reliability analysis of masked data in adaptive step-stress partially accelerated lifetime tests with progressive removal

DOI10.1080/03610926.2015.1122058zbMath1369.62271OpenAlexW2429096865MaRDI QIDQ5349152

Ruibing Wang, Yimin Shi, Jing Cai, Bin Liu

Publication date: 23 August 2017

Published in: Communications in Statistics - Theory and Methods (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/03610926.2015.1122058

zbMATH Keywords

Lindley distributionadaptive rejection samplingtampered failure rate modeladaptive step-stress partially accelerated lifetime testEM-QN algorithm

Mathematics Subject Classification ID

Bayesian inference (62F15) Testing in survival analysis and censored data (62N03) Reliability and life testing (62N05)

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