Reliability Enhancement of Flash-Memory Storage Systems: An Efficient Version-Based Design

DOI10.1109/TC.2012.131zbMath1372.68037MaRDI QIDQ5369898

Po-Chun Huang, Tei-Wei Kuo, Yuan-Hao Chang, Pei-Han Hsu, David H. C. Du, Lue-Jane Lee

Publication date: 19 October 2017

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15)

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