Increased throughput for the testing and repair of RAMs with redundancy

DOI10.1109/12.73586zbMath1395.68052OpenAlexW2106825113MaRDI QIDQ5375392

Ramsey W. Haddad, Anup B. Sharma, Anton T. Dahbura

Publication date: 14 September 2018

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/12.73586

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15)

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