DNA computing approach for automated test pattern generation for digital circuits

DOI10.1080/00207720701748281zbMath1283.94166OpenAlexW1975773858MaRDI QIDQ5402738

Maninder Kaur, Amardeep Singh

Publication date: 17 March 2014

Published in: International Journal of Systems Science (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/00207720701748281

zbMATH Keywords

genetic algorithmDNA computingmolecular computingsimulation annealingATPG

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Cites Work

• Optimization by Simulated Annealing
• Polynomially Complete Fault Detection Problems
• On applying molecular computation to binary linear codes
• APPLYING QUANTUM SEARCH TO AUTOMATED TEST PATTERN GENERATION FOR VLSI CIRCUITS

This page was built for publication: DNA computing approach for automated test pattern generation for digital circuits