Black-box identity testing of depth-4 multilinear circuits
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Publication:5419112
DOI10.1145/1993636.1993693zbMath1288.68137OpenAlexW2109995168MaRDI QIDQ5419112
Ilya Volkovich, Shubhangi Saraf
Publication date: 5 June 2014
Published in: Proceedings of the forty-third annual ACM symposium on Theory of computing (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1145/1993636.1993693
derandomizationarithmetic circuitspolynomial identity testingbounded depth circuitsmultilinear circuits
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