Blackbox identity testing for bounded top fanin depth-3 circuits

DOI10.1145/1993636.1993694zbMath1288.68138OpenAlexW2087857477MaRDI QIDQ5419113

C. Seshadhri, Nitin Saxena

Publication date: 5 June 2014

Published in: Proceedings of the forty-third annual ACM symposium on Theory of computing (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1145/1993636.1993694

zbMATH Keywords

blackboxderandomizationpolynomial identity testingfan-indepth-3 circuitsChinese remaindering

Mathematics Subject Classification ID

Related Items (5)

Subexponential size hitting sets for bounded depth multilinear formulas ⋮ Exact learning from an honest teacher that answers membership queries ⋮ A case of depth-3 identity testing, sparse factorization and duality ⋮ Algebraic Independence and Blackbox Identity Testing ⋮ Jacobian Hits Circuits: Hitting Sets, Lower Bounds for Depth-$D$ Occur-$k$ Formulas and Depth-3 Transcendence Degree-$k$ Circuits

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