Estimating process yield based on Spk for multiple samples

DOI10.1080/00207540600600122zbMath1128.90426OpenAlexW1980137164MaRDI QIDQ5444450

Wen Lea Pearn, Ya Ching Cheng

Publication date: 25 February 2008

Published in: International Journal of Production Research (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/00207540600600122

zbMATH Keywords

multiple samplesprocess capabilityprocess yield

Mathematics Subject Classification ID

Production models (90B30)

Related Items (4)

Measuring the manufacturing process yield based on fuzzy data ⋮ Procedure of the convolution method for estimating production yield with sample size information ⋮ Production yield measure for multiple characteristics processes based on \(S^T_{pk}\) under multiple samples ⋮ Sample size determination for production yield estimation with multiple independent process characteristics

Cites Work

• Estimation of σ and the process capability index based on subsamples
• Lower Confidence Limits on Process Capability Indices Based on the Range
• Brocess capability with asymmetric tolerances

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