One-dimensional-based automatic defect inspection of multiple patterned TFT-LCD panels using Fourier image reconstruction

DOI10.1080/00207540600622464zbMath1128.90331OpenAlexW2000820311MaRDI QIDQ5444491

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Publication date: 25 February 2008

Published in: International Journal of Production Research (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/00207540600622464

zbMATH Keywords

Fourier transformscomputer visiondefect detectionautomated inspectionthin film transistor-liquid crystal display (TFT-LCD)

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25)

Related Items (1)

Defect detection in periodically patterned surfaces using independent component analysis

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