Sampling methods for low-frequency electromagnetic imaging

DOI10.1088/0266-5611/24/1/015007zbMath1137.78315OpenAlexW2157102972WikidataQ59895994 ScholiaQ59895994MaRDI QIDQ5459033

Martin Hanke, Christoph Schneider, Bastian Harrach

Publication date: 24 April 2008

Published in: Inverse Problems (Search for Journal in Brave)

Full work available at URL: https://semanticscholar.org/paper/27ed1a1f6fab2458d5a5029c76b5f543a7009732

zbMATH Keywords

detectorHelmholtz equationscattererelectrostatic limitmagnetostatic limit

Mathematics Subject Classification ID

Diffraction, scattering (78A45) Laplace operator, Helmholtz equation (reduced wave equation), Poisson equation (35J05) Technical applications of optics and electromagnetic theory (78A55) Inverse problems (including inverse scattering) in optics and electromagnetic theory (78A46)

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Indicator Functions for Shape Reconstruction Related to the Linear Sampling Method ⋮ Topological Sensitivity for Solving Inverse Multiple Scattering Problems in Three-dimensional Electromagnetism. Part I: One Step Method

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