Application and Reliability of Change-Point Analyses for Detecting a Defective Stage in Integrated Circuit Manufacturing

DOI10.1080/03610910600591602zbMath1099.62134OpenAlexW2086500682MaRDI QIDQ5481633

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Publication date: 10 August 2006

Published in: Communications in Statistics - Simulation and Computation (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/03610910600591602

zbMATH Keywords

Markov chain Monte Carloquality controlbaggingchange-point analysisoptimal segmentation

Mathematics Subject Classification ID

Bayesian inference (62F15) Applications of statistics in engineering and industry; control charts (62P30) Signal detection and filtering (aspects of stochastic processes) (60G35) Applications of Markov chains and discrete-time Markov processes on general state spaces (social mobility, learning theory, industrial processes, etc.) (60J20) Numerical analysis or methods applied to Markov chains (65C40)

Cites Work

• Reversible jump Markov chain Monte Carlo computation and Bayesian model determination
• Using penalized contrasts for the change-point problem
• Automatic Bayesian Curve Fitting
• Monte Carlo sampling methods using Markov chains and their applications
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