Derivation of Minimal Complete Sets of Test-Input Sequences Using Boolean Differences

DOI10.1109/T-C.1971.223077zbMath0213.17902MaRDI QIDQ5615043

Peter N. Marinos

Publication date: 1971

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Related Items (7)

Complete test-set generation for bridging faults in combinational-logic circuits ⋮ Boolean integral calculus ⋮ An efficient algorithm for single and multiple fault test sets generation ⋮ A graph-theoretic multiple logic fault analysis through petri-nets ⋮ Boolean difference techniques in fault tree analysis ⋮ Transition submatrices in regular homing experiments and identification of sequential machines of known class using direct-sum transition matrices ⋮ Algebraic analysis of multiple faults in combinational networks

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