A Random and an Algorithmic Technique for Fault Detection Test Generation for Sequential Circuits

DOI10.1109/T-C.1971.223140zbMath0225.94023OpenAlexW2072647403MaRDI QIDQ5632459

Melvin A. Breuer

Publication date: 1971

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/t-c.1971.223140

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

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