Bounds on the Length of Terminal Stuck-Fault Test

DOI10.1109/TC.1972.5008955zbMath0229.94019OpenAlexW2078985975MaRDI QIDQ5638213

C. Dennis Weiss

Publication date: 1972

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tc.1972.5008955

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Related Items (3)

On test sets concerning local stuck-at faults of fixed multiplicity at the inputs of circuits ⋮ Complexity of tests checking the operation of logic diagram inputs ⋮ Tests concerning certain types of faults at the scheme inputs

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