Derivation of Minimum Test Sets for Unate Logical Circuits

DOI10.1109/T-C.1971.223126zbMath0231.94034MaRDI QIDQ5639631

Rodolfo Betancourt

Publication date: 1971

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Related Items (1)

Algebraic analysis of multiple faults in combinational networks

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