Simulation of longitudinal instabilities in filamentary current flow during low‐temperature impurity breakdown in semiconductors

DOI10.1002/ZAMM.200510234zbMath1138.82369OpenAlexW2145257620MaRDI QIDQ5704832

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Publication date: 15 November 2005

Published in: ZAMM - Journal of Applied Mathematics and Mechanics / Zeitschrift für Angewandte Mathematik und Mechanik (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1002/zamm.200510234

zbMATH Keywords

simulationsemiconductorsinstabilitiescurrent filaments

Mathematics Subject Classification ID

Statistical mechanics of superconductors (82D55) Statistical mechanics of semiconductors (82D37) Statistical mechanics of magnetic materials (82D40)

Uses Software

• WIAS-TeSCA

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