Reconstruction of contact regions in semiconductor transistors using Dirichlet-Neumann cost functional approach

DOI10.1080/00036811.2019.1623393zbMath1460.49026OpenAlexW2947370755MaRDI QIDQ5856186

Mourad Hrizi, Maatoug Hassine

Publication date: 24 March 2021

Published in: Applicable Analysis (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/00036811.2019.1623393

zbMATH Keywords

inverse problemtopology optimizationtopological sensitivity analysisKohn-Vogelius formulationnoniterative reconstruction method

Mathematics Subject Classification ID

Optimization of shapes other than minimal surfaces (49Q10) Numerical methods for inverse problems for initial value and initial-boundary value problems involving PDEs (65M32) Inverse problems in optimal control (49N45) Variational methods applied to problems in optics and electromagnetic theory (78M30) Sensitivity analysis for optimization problems on manifolds (49Q12)

Related Items (4)

Topological sensitivity method for reconstruction of the spatial component in the source term of a time-fractional diffusion equation ⋮ Reconstruction and stability analysis of potential appearing in time‐fractional subdiffusion ⋮ Topological asymptotic expansion for a thermal problem ⋮ A noniterative reconstruction method for solving a time-fractional inverse source problem from partial boundary measurements

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