Universal Address Sequence Generator for Memory Built-in Self-test*

DOI10.3233/FI-222141zbMath1506.68006arXiv2208.05325MaRDI QIDQ5880943

V. N. Yarmolik, Ireneusz Mrozek, N. A. Shevchenko

Publication date: 9 March 2023

Published in: Fundamenta Informaticae (Search for Journal in Brave)

Full work available at URL: https://arxiv.org/abs/2208.05325

zbMATH Keywords

multiple testsRAM testingantirandom testscontrolled random tests

Mathematics Subject Classification ID

Mathematical problems of computer architecture (68M07)

Cites Work

• Unnamed Item
• The repeated nondestructive march tests with variable address sequences
• Multiple Controlled Random Testing*
• Testing Neighbouring Cell Leakage and Transition Induced Faults in DRAMs
• Randomized Quasi-Random Testing
• Detection oF Pattern-Sensitive Faults in Random-Access Memories
• A Survey of Combinatorial Gray Codes

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