Optimal burn-in decision for products with an unimodal failure rate function

DOI10.1016/S0377-2217(99)00308-2zbMath0976.90030OpenAlexW2033659397MaRDI QIDQ5928445

Dong Shang Chang

Publication date: 28 March 2001

Published in: European Journal of Operational Research (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/s0377-2217(99)00308-2

zbMATH Keywords

reliabilityconstrained optimizationburn-incritical timemean residual life

Mathematics Subject Classification ID

Applications of mathematical programming (90C90) Reliability, availability, maintenance, inspection in operations research (90B25)

Related Items (9)

Effects of manufacturing defects on the device failure rate ⋮ Burn-in for a time-transformed exponential model ⋮ Burn-in considering yield loss and reliability gain for integrated circuits ⋮ Determination of the optimal accelerated burn-in time under Arrhenius-log normal distribution assumption ⋮ Using parametric classification trees for model selection with applications to financial risk management ⋮ Burn-in and the performance quality measures in heterogeneous populations ⋮ The Optimal Burn-in: State of the Art and New Advances for Cost Function Formulation ⋮ Statistical inference about the shape parameter of the Burr type XII distribution under the failure-censored sampling plan ⋮ Optimal burn-in for maximizing reliability of repairable non-series systems

Cites Work

• On the reliability studies of a weighted inverse Gaussian model
• Estimating the critical time of the inverse Gaussian hazard rate
• A Reliability Distribution with Increasing, Decreasing, Constant and Bathtub-Shaped Failure Rates
• Reliability bounds and critical time for the Birnbaum-Saunders distribution
• Tolerance limits for inverse gaussian distribution

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