Forecasting the efficiency of test generation algorithms for combinational circuits

DOI10.1007/BF02948868zbMath0969.68635MaRDI QIDQ5938663

Tukwasibwe Justaf Frank, Shiyi Xu

Publication date: 1 October 2001

Published in: Journal of Computer Science and Technology (Search for Journal in Brave)

zbMATH Keywords

genetic algorithmforecastingtest generationtestability

Mathematics Subject Classification ID

Computing methodologies and applications (68U99) Hardware implementations of nonnumerical algorithms (VLSI algorithms, etc.) (68W35) Fault detection; testing in circuits and networks (94C12)

Uses Software

• Genocop

Cites Work

• An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits
• A Nine-Valued Circuit Model for Test Generation
• Diagnosis of Automata Failures: A Calculus and a Method
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