Statistical quality control using image intelligence: A sparse learning approach
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Publication:6051603
DOI10.1002/nav.22069OpenAlexW4289766482MaRDI QIDQ6051603
Publication date: 20 October 2023
Published in: Naval Research Logistics (NRL) (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1002/nav.22069
waveletsedgeshigh-dimensionalmultivariate statistical process controlfault isolationEWMAimage monitoring
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