Developing process-yield-based acceptance sampling plans for AR(1) auto-correlated process
DOI10.1080/03610918.2021.1958845OpenAlexW3196502149MaRDI QIDQ6082989
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Publication date: 7 December 2023
Published in: Communications in Statistics - Simulation and Computation (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/03610918.2021.1958845
variables sampling planprocess yield indexquick switching sampling systemfirst-order auto-regressive \((\mathrm{AR}(1))\)
Time series, auto-correlation, regression, etc. in statistics (GARCH) (62M10) Parametric hypothesis testing (62F03) Applications of statistics in engineering and industry; control charts (62P30) Applications of mathematical programming (90C90)
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Cites Work
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- A modified variables repetitive group sampling plan with the consideration of preceding lots information
- Optimal design of overall yield-based variable repetitive sampling plans for processes with multiple characteristics
- Sampling schemes by variables inspection for the first-order autoregressive model between linear profiles
- Capability-based quick switching sampling system for lot disposition
- Repetitive group sampling procedure for variables inspection
- Estimating process capability indexes for autocorrelated data
- Zero acceptance number quick switching system for compliance sampling
- Brocess capability with asymmetric tolerances
- Designing variables sampling plans based on the yield index Spk
- A new multiple dependent state sampling plan based on the process capability index
- Developing and designing of an efficient variables sampling system based on the process capability index
- An improved sampling plan by variables inspection with consideration of process yield and quality loss
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