Robust estimation based on one-shot device test data under log-normal lifetimes

DOI10.1080/02331888.2023.2240925arXiv2211.02118MaRDI QIDQ6083197

Elena Castilla, Narayanaswamy Balakrishnan

Publication date: 31 October 2023

Published in: Statistics (Search for Journal in Brave)

Full work available at URL: https://arxiv.org/abs/2211.02118

zbMATH Keywords

robustnessreliabilitydivergencesone-shot devices

Mathematics Subject Classification ID

Statistics (62-XX)

Cites Work

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• Robust estimation for independent non-homogeneous observations using density power divergence with applications to linear regression
• On the choice of the optimal tuning parameter in robust one-shot device testing analysis
• Discriminating between the Weibull and log-normal distributions for Type-II censored data
• A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring
• Robust and efficient estimation by minimising a density power divergence
• OPTIMAL DESIGN OF SIMPLE STEP-STRESS ACCELERATED LIFE TESTS FOR ONE-SHOT DEVICES UNDER EXPONENTIAL DISTRIBUTIONS
• Choosing a robustness tuning parameter
• On the ‘optimal’ density power divergence tuning parameter

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