On test sets concerning local stuck-at faults of fixed multiplicity at the inputs of circuits

DOI10.1134/s0001434623090109zbMath1530.94072MaRDI QIDQ6084899

Dmitry S. Romanov, Grigoriy V. Antyufeev

Publication date: 7 November 2023

Published in: Mathematical Notes (Search for Journal in Brave)

zbMATH Keywords

Boolean functionShannon functiondiagnostic test setdetection test setstuck-at faults at inputs of circuits

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Switching theory, applications of Boolean algebras to circuits and networks (94C11) Boolean functions (94D10)

Cites Work

• Complete tests relative to displacing faults of inputs of circuits
• Tests with stuck-at and shift faults on circuit inputs
• LOWER BOUNDS FOR LENGTHS OF COMPLETE DIAGNOSTIC TESTS FOR CIRCUITS AND INPUTS OF CIRCUITS
• Bounds on the Length of Terminal Stuck-Fault Test
• Unnamed Item
• Unnamed Item
• Unnamed Item
• Unnamed Item

This page was built for publication: On test sets concerning local stuck-at faults of fixed multiplicity at the inputs of circuits