Non-uniform, axisymmetric misfit strain in thin films bonded on plate substrates/substrate systems: the relation between non-uniform film stresses and system curvatures

DOI10.1007/S10409-005-0051-9zbMath1200.74103OpenAlexW2400238434MaRDI QIDQ608625

Sumit K. Garg

Publication date: 25 November 2010

Published in: Acta Mechanica Sinica (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s10409-005-0051-9

zbMATH Keywords

non-local effectsinterfacial shearsnon-uniform misfit strainnon-uniform wafer curvaturesstress-curvature relations

Mathematics Subject Classification ID

Thin films (74K35)

Related Items (3)

Multi-layer thin films/substrate system subjected to non-uniform misfit strains ⋮ Sharp-interface formation during lithium intercalation into silicon ⋮ Programmable spiral and helical deformation behaviors of hydrogel-based bi-material beam structures

Cites Work

• Bifurcation in isotropic thin film/substrate plates
• Thermoelastic analysis of periodic thin lines deposited on a substrate
• Substrate curvature due to thin film mismatch strain in the nonlinear deformation range
• Geometrically nonlinear stress-deflection relations for thin film/substrate systems
• Thin Film Materials

This page was built for publication: Non-uniform, axisymmetric misfit strain in thin films bonded on plate substrates/substrate systems: the relation between non-uniform film stresses and system curvatures