Measuring one-sided process capability index for autocorrelated data in the presence of random measurement errors

DOI10.1515/eqc-2023-0020OpenAlexW4387308198MaRDI QIDQ6120481

Kuntal Bera, Unnamed Author

Publication date: 25 March 2024

Published in: Stochastics and Quality Control (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1515/eqc-2023-0020

zbMATH Keywords

stationaryautocorrelationmeasurement errorsprocess capability index

Mathematics Subject Classification ID

Applications of statistics in engineering and industry; control charts (62P30)

Cites Work

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• Estimating process capability indexes for autocorrelated data
• Estimating total and specific process capability indices in three-stage processes with measurement errors
• Side-sensitive synthetic and runs-rules charts for monitoring AR(1) processes with skipping sampling strategies
• The new synthetic and runs-rules schemes to monitor the process mean of autocorrelated observations with measurement errors
• The effect of measurement error on the process incapability index
• Effect of measurement error and autocorrelation on theX¯chart
• Finite sample performance of an estimator of process capability index C _pm for the autocorrelated data

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