A unified approach for predicting long- and short-term capability indices with dependence on manufacturing target bias

DOI10.1155/2008/594753zbMath1202.62190OpenAlexW2047516874WikidataQ58646078 ScholiaQ58646078MaRDI QIDQ613738

Nikhil T. Satyala, R. J. Pieper

Publication date: 22 December 2010

Published in: International Journal of Quality, Statistics, and Reliability (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1155/2008/594753

Mathematics Subject Classification ID

Inference from stochastic processes and prediction (62M20) Applications of statistics in engineering and industry; control charts (62P30)

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Uses Software

• Matlab

Cites Work

• A unified approach for predicting long- and short-term capability indices with dependence on manufacturing target bias
• Some Process Capability Indices are More Reliable than One Might Think
• Brocess capability with asymmetric tolerances