Damage mapping via electrical impedance tomography in complex AM shapes using mixed smoothness and Bayesian regularization

DOI10.1016/j.cma.2023.116185OpenAlexW4382877213MaRDI QIDQ6171235

Tyler N. Tallman, J. Wertz, Mark Flores, Laura Homa

Publication date: 11 August 2023

Published in: Computer Methods in Applied Mechanics and Engineering (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.cma.2023.116185

zbMATH Keywords

inverse problemselectrical impedance tomographyBayesian methodsadditive manufacturingnondestructive evaluationmixed regularization

Mathematics Subject Classification ID

Mechanics of deformable solids (74-XX) Biology and other natural sciences (92-XX)

Cites Work

• Topology optimization of functionally graded anisotropic composite structures using homogenization design method
• Magnetic Resonance Electrical Impedance Tomography (MREIT)
• Bayesian mixture models for source separation in MEG
• A Gaussian hypermodel to recover blocky objects
• Existence and Uniqueness for Electrode Models for Electric Current Computed Tomography
• Bayesian statistical inference using a regression in electrical impedance tomography
• A nonlinear approach to difference imaging in EIT; assessment of the robustness in the presence of modelling errors

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