Shannon function of the test length with respect to gate input identification

DOI10.1007/s10598-023-09589-yOpenAlexW4387221411MaRDI QIDQ6195911

A. N. Mal'tsev

Publication date: 14 March 2024

Published in: Computational Mathematics and Modeling (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s10598-023-09589-y

zbMATH Keywords

diagnostic testdetection testinput identification

Mathematics Subject Classification ID

Circuits, networks (94Cxx) Boolean functions (94D10) Systems theory; control (93-XX)

Cites Work

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• Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases
• ON LOGIC NETWORKS ALLOWING SHORT SINGLE FAULT DETECTION TESTS UNDER ARBITRARY FAULTS OF GATES
• Short single fault detection tests for logic networks under arbitrary faults of gates
• Easily Testable Realizations ror Logic Functions

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