Asymptotically optimally reliable circuits in the basis \(\{x_{1} \and x_{2} \and x_{3}, x_{1} \vee x_{2} \vee x_{3}, \overline {x}_{1}\}\) for inverse faults at the inputs of elements

DOI10.1134/S0001434611030138zbMATH Open1245.94118OpenAlexW27907062MaRDI QIDQ650442

V. V. Chugunova

Publication date: 25 November 2011

Published in: Mathematical Notes (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1134/s0001434611030138

zbMATH Keywords

Boolean functionAND gateinverse faultoptimally reliable circuitOR gateunreliable functional elementvoting function

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

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