Gaussian process modeling for engineered surfaces with applications to Si wafer production

DOI10.1002/sta4.26MaRDI QIDQ6537848

V. Roshan Joseph, Matthew Plumlee, Jianjun Shi, Ran Jin

Publication date: 14 May 2024

Published in: Stat (Search for Journal in Brave)

zbMATH Keywords

functional responsequality controlstatistical process controldesigned experiment

Mathematics Subject Classification ID

Statistics (62-XX)

Cites Work

• Spatial variation. 2nd ed
• The design and analysis of computer experiments.
• Handbook of Spatial Statistics
• Regression Analysis for a Functional Response
• A Nonstationary Multisite Model for Rainfall
• Stochastic Models That Separate Fractal Dimension and the Hurst Effect
• Semiparametric Models for Longitudinal Data with Application to CD4 Cell Numbers in HIV Seroconverters
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