Multilevel double loop Monte Carlo and stochastic collocation methods with importance sampling for Bayesian optimal experimental design
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Publication:6553495
DOI10.1002/nme.6367zbMath1548.62194MaRDI QIDQ6553495
L. F. R. Espath, Ben Mansour Dia, Joakim Beck, Raúl Tempone
Publication date: 11 June 2024
Published in: International Journal for Numerical Methods in Engineering (Search for Journal in Brave)
multilevelimportance samplingelectrical impedance tomographystochastic collocationexpected information gain
Related Items (3)
Optimal experimental design: formulations and computations ⋮ Greedy selection of optimal location of sensors for uncertainty reduction in seismic moment tensor inversion ⋮ Efficient estimation of expected information gain in Bayesian experimental design with multi-index Monte Carlo
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