Morphological stability of electrostrictive thin films

DOI10.1016/J.IJENGSCI.2024.104073MaRDI QIDQ6553670

P. W. Voorhees, Jin Zhang

Publication date: 11 June 2024

Published in: International Journal of Engineering Science (Search for Journal in Brave)

zbMATH Keywords

oxidationthin filmbreakdowncorrosionelectromechanical processes

Mathematics Subject Classification ID

Thin films (74K35)

Cites Work

• A theoretical analysis of the breakdown of electrostrictive oxide film on metal
• A nonlinear field theory of deformable dielectrics
• Nonlinear electroelasticity
• Effect of electrostriction on the self-organization of porous nanostructures in anodized aluminum oxide

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