Industrial statistics applications in the semiconductor industry: some examples

DOI10.1002/asmb.1959MaRDI QIDQ6570835

Ron S. Kenett, S. Zacks

Publication date: 10 July 2024

Published in: Applied Stochastic Models in Business and Industry (Search for Journal in Brave)

zbMATH Keywords

applied statisticsprocess monitoringprocess capabilitymultivariate process control

Mathematics Subject Classification ID

Statistics (62-XX)

Cites Work

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• Optimal detection of a change in distribution
• Smallest nonparametric tolerance regions.
• Multivariate statistical process control with industrial applications
• Multivariate quality control
• Comparison of Approximation Methods for Computing Tolerance Factors for a Multivariate Normal Population
• On Optimum Methods in Quickest Detection Problems
• Estimating the Current Mean of a Normal Distribution which is Subjected to Changes in Time

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