Failure probability estimation with differently sized reference products for semiconductor burn-in studies

DOI10.1002/asmb.2100MaRDI QIDQ6574671

Horst Lewitschnig, Jürgen Pilz, Daniel Kurz

Publication date: 18 July 2024

Published in: Applied Stochastic Models in Business and Industry (Search for Journal in Brave)

zbMATH Keywords

combinatoricsburn-inbinomial distributionarea scalingsemiconductor reliability

Mathematics Subject Classification ID

Statistics (62-XX)

Cites Work

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