Applications of likelihood based-methods for the reliability parameter of the location and scale exponential distribution

Shaul K. Bar-Lev, Frank A. Van der Duyn Schouten

Publication date: 2 August 2024

Published in: Journal of Applied Statistical Science (Search for Journal in Brave)

Censored data models (62N01) Testing in survival analysis and censored data (62N03) Reliability and life testing (62N05)

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