An X-ray fluorescence depth distribution function for electron beam microanalysis

DOI10.3103/S1062873810070245zbMath1233.82038MaRDI QIDQ664016

E. V. Shirokova, N. N. Mikheev, M. A. Stepovich

Publication date: 28 February 2012

Published in: Bulletin of the Russian Academy of Sciences: Physics (Search for Journal in Brave)

zbMATH Keywords

electron beam microanalysis

Mathematics Subject Classification ID

Transport processes in time-dependent statistical mechanics (82C70) Electron optics (78A15)

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