Optimal component test plans for a parallel system based on type-II censoring

DOI10.1016/j.stamet.2007.11.001zbMath1248.90044OpenAlexW1988337974MaRDI QIDQ713880

Palaniappan Vellaisamy, Mahesh Kumar

Publication date: 19 October 2012

Published in: Statistical Methodology (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.stamet.2007.11.001

zbMATH Keywords

algorithmsinteger programmingsystem reliabilitymaximum likelihood estimatestype-II censoringparallel systemcomponent test plansconsumer's riskexponential lifetimesproducer's risk

Mathematics Subject Classification ID

Censored data models (62N01) Applications of statistics in engineering and industry; control charts (62P30) Mixed integer programming (90C11) Reliability, availability, maintenance, inspection in operations research (90B25) Reliability and life testing (62N05)

Related Items

Design of component reliability test plan for a series system having time dependent testing cost with the presence of covariates

Cites Work

• A Component-Testing Procedure For A Parallel System With Type II Censoring
• A Comparison of Several Component-Testing Plans For A Parallel System
• A type-II censored, log test time based, component-testing procedure for a parallel system
• An Optimum Procedure for Component Testing in the Demonstration of Series System Reliability
• Minimum cost component test plans for evaluating reliability of a highly reliable parallel system
• Two-stage component test plans for testing the reliability of a series system
• Designing Component Test Plans for Series System Reliability via Mathematical Programming

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