Reliability nonparametric Bayesian estimation for the masked data of parallel systems in step-stress accelerated life tests
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Publication:730563
DOI10.1016/j.cam.2016.07.029zbMath1352.62157OpenAlexW2512032955MaRDI QIDQ730563
Fode Zhang, Xuchao Bai, Bin Liu, Yimin Shi
Publication date: 28 December 2016
Published in: Journal of Computational and Applied Mathematics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.cam.2016.07.029
power functionparallel systemstep-stress accelerated life testDirichlet multivariate processmasked data
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Cites Work
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- Inference for accelerated competing failure models from Weibull distribution under type-I progressive hybrid censoring
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- Nonparametric Bayesian Analysis of Competing Risks Problem with Masked Data
- Accelerated Life Testing - Step-Stress Models and Data Analyses
- Expressing the Kaplan-Meier Estimator as a Function of Empirical Subsurvival Functions
- Bayesian nonparametric estimation in a series system or a competing-risks model
- On Nonparametric Estimation in Accelerated Experiments with Step-Stresses
- Inference on progressive-stress model for the exponentiated exponential distribution under type-II progressive hybrid censoring
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