Bayesian accelerated life testing under competing log-location-scale family of causes of failure

DOI10.1007/s00180-015-0602-xzbMath1342.65052OpenAlexW1215809912MaRDI QIDQ736577

Chiranjit Mukhopadhyay, Soumya Roy

Publication date: 4 August 2016

Published in: Computational Statistics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s00180-015-0602-x

zbMATH Keywords

reliabilityGibbs samplingpredictive inferencedata augmentationmodel averagingseries systemlog-concave densitiesstress translation function

Mathematics Subject Classification ID

Computational methods for problems pertaining to statistics (62-08) Reliability and life testing (62N05)

Related Items (4)

Change-point detection of failure mechanism for electronic devices based on Arrhenius model ⋮ Inference for log‐location‐scale family of distributions under competing risks with progressive type‐I interval censored data ⋮ BayesianD-optimal Accelerated Life Test plans for series systems with competing exponential causes of failure ⋮ Bayesian accelerated life test plans for series systems with Weibull component lifetimes

Uses Software

• BayesDA
• SPLIDA

Cites Work

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