Utilizing the information theory of entropy to solve an off-line inspection problem
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Publication:766257
DOI10.1007/s10288-011-0179-3zbMath1233.90135OpenAlexW1970599777MaRDI QIDQ766257
Chih-Hsiung Wang, Neng-Hui Shih, W. C. Tsai
Publication date: 23 March 2012
Published in: 4OR (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1007/s10288-011-0179-3
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Cites Work
- Optimal lot size and offline inspection policy
- Optimal production run time for a deteriorating production system under an extended inspection policy
- Effect of maintenance on the economic design of \(\overline x\)-control chart
- Optimal lot size and inspection policy for products sold with warranty
- AN OFFLINE INSPECTION AND DISPOSITION MODEL INCORPORATING DISCRETE WEIBULL DISTRIBUTION AND MANUFACTURING VARIATION
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