Stress-induced electric potential barriers in thickness-stretch deformations of a piezoelectric semiconductor plate
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Publication:823929
DOI10.1007/S00707-021-03059-5zbMath1479.74084OpenAlexW3201661302MaRDI QIDQ823929
Feng Jin, Yilin Qu, Jia-shi Yang
Publication date: 16 December 2021
Published in: Acta Mechanica (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1007/s00707-021-03059-5
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- Dynamic Anti-plane Crack Analysis in Functional Graded Piezoelectric Semiconductor Crystals
- An Introduction to the Mathematical Theory of Vibrations of Elastic Plates
- Analysis of Piezoelectric Semiconductor Structures
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