Easily testable circuits in Zhegalkin basis in the case of constant faults of type ``1 at gate outputs

DOI10.1515/DMA-2020-0026zbMath1466.94064OpenAlexW3097936555MaRDI QIDQ828193

Yulia V. Borodina

Publication date: 8 January 2021

Published in: Discrete Mathematics and Applications (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1515/dma-2020-0026

zbMATH Keywords

Boolean circuitsconstant faultsfault detection testsZhegalkin basis

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Switching theory, applications of Boolean algebras to circuits and networks (94C11)

Related Items (2)

Some classes of easily testable circuits in the Zhegalkin basis ⋮ On self-correcting logic circuits of unreliable gates with at most two inputs

Cites Work

• Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements
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