Tests with stuck-at and shift faults on circuit inputs

DOI10.1007/S10598-021-09511-4zbMath1460.94095OpenAlexW3128117697MaRDI QIDQ831000

Dmitry S. Romanov, Grigoriy V. Antyufeev

Publication date: 10 May 2021

Published in: Computational Mathematics and Modeling (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s10598-021-09511-4

zbMATH Keywords

shiftBoolean functionteststuck-at faults on circuit inputs

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Switching theory, applications of Boolean algebras to circuits and networks (94C11) Boolean functions (94D10)

Related Items (1)

On test sets concerning local stuck-at faults of fixed multiplicity at the inputs of circuits

Cites Work

• Unnamed Item
• LOWER BOUNDS FOR LENGTHS OF COMPLETE DIAGNOSTIC TESTS FOR CIRCUITS AND INPUTS OF CIRCUITS

This page was built for publication: Tests with stuck-at and shift faults on circuit inputs