Analysis of vertical cracking phenomena in tensile-strained epitaxial film on a substrate. II. Application to inxga1 - xas/InP system

DOI10.1016/J.IJSOLSTR.2007.08.037zbMath1167.74552OpenAlexW2091331787MaRDI QIDQ833941

Youn Y. Earmme, Saebom Lee, Seung Tae Choi

Publication date: 14 August 2009

Published in: International Journal of Solids and Structures (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.ijsolstr.2007.08.037

zbMATH Keywords

anisotropic elasticitychanneling crackcritical condition for crack formationepitaxial film/substrate systemperiodic array of channeling cracks

Mathematics Subject Classification ID

Brittle fracture (74R10) Thin films (74K35)

Related Items (1)

Effect of elastic constants on crack channeling in a thin film bonded to an orthotropic substrate

Cites Work

• Generalized Dundurs constants for anisotropic bimaterials
• Elastic study on singularities interacting with interfaces using alternating technique. I: Anisotropic trimaterial.
• Dependence of stress on elastic constants in an anisotropic bimaterial under plane deformation; and the interfacial crack
• Analysis of vertical cracking phenomena in tensile-strained epitaxial film on a substrate. I: Mathematical formulation
• Mixed Mode Cracking in Layered Materials
• Thin Film Materials

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