Critical thickness for misfit twinning in an epilayer

DOI10.1016/J.IJSOLSTR.2008.01.018zbMath1169.74481OpenAlexW2009944120MaRDI QIDQ837302

Tong-Yi Zhang, Lilin Liu, Yousheng Zhang

Publication date: 10 September 2009

Published in: International Journal of Solids and Structures (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.ijsolstr.2008.01.018

zbMATH Keywords

thin filmheteroepitaxialmisfit twinSomigliana dislocation dipole

Mathematics Subject Classification ID

Thin films (74K35)

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