New-age: A negative bias temperature instability-estimation framework for microarchitectural components

DOI10.1007/s10766-009-0104-yzbMath1186.68083OpenAlexW2066959447MaRDI QIDQ839019

Yu Cao, Yuan Xie, Wenping Wang, Varsha Balakrishnan, Michael DeBole, Hong Luo, Yu Wang, Ramakrishnan Krishnan, Narayanan Vijaykrishnan

Publication date: 1 September 2009

Published in: International Journal of Parallel Programming (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s10766-009-0104-y

zbMATH Keywords

microprocessor reliabilityNBTI frameworknegative bias temperature instabilityreliable systems

Mathematics Subject Classification ID

Computer system organization (68M99)