Nonlinear dynamics, stability and control of the scan process in noncontacting atomic force microscopy

DOI10.1007/S11071-008-9335-5zbMath1178.74122OpenAlexW2140652510MaRDI QIDQ840474

S. Hornstein, Oded Gottlieb

Publication date: 11 September 2009

Published in: Nonlinear Dynamics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s11071-008-9335-5

zbMATH Keywords

nonlinear microbeamAtomic Force Microscopy (AFM)escape bifurcationMelnikov-Holmes stabilityMoon-Chirikov overlapscan dynamics

Mathematics Subject Classification ID

Control, switches and devices (``smart materials) in solid mechanics (74M05) Micromechanics of solids (74M25) Stability of dynamical problems in solid mechanics (74H55)

Related Items (2)

An electrically actuated imperfect microbeam: dynamical integrity for interpreting and predicting the device response ⋮ Asymptotic analysis of a noncontact AFM microcantilever sensor with external feedback control

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• Chaotic phenomena triggering the escape from a potential well
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